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Ando, Masami; Nozawa, Takashi; Hirose, Takanori; Tanigawa, Hiroyasu; Wakai, Eiichi; Stoller, R. E.*; Myers, J.*
Fusion Science and Technology, 68(3), p.648 - 651, 2015/10
Times Cited Count：3 Percentile：25.85(Nuclear Science & Technology)Pressurized tubes of F82H and B-doped F82H irradiated at 573 and 673 K up to 
6dpa have been measured by a laser profilometer. The irradiation creep strain in F82H irradiated at 573 and 673 K was almost linearly dependent on the effective stress level for stresses below 260 MPa and 170 MPa, respectively. The creep strain of 
BN-F82H was similar to that of F82H IEA at each effective stress level except 294 MPa at 573 K irradiation. For 673 K irradiation, the creep strain of some BN-F82H tubes was larger than that of F82H tubes. It is suggested that a swelling caused in each BN-F82H because small helium babbles might be produced by a reaction of B(n, 
) 
Li.
Ando, Masami; Wakai, Eiichi; Sawai, Tomotsugu; Matsukawa, Shingo; Naito, Akira*; Jitsukawa, Shiro; Oka, Keiichiro*; Tanaka, Teruyuki*; Onuki, Somei*
JAERI-Review 2004-025, TIARA Annual Report 2003, p.159 - 161, 2004/11
The objectives of this study are to evaluate radiation hardening on ion-irradiated F82H up to 100 dpa and to examine the extra component of radiation hardening due to implanted helium atoms (up to 3000 appmHe) in F82H under ratio of 0, 10, 100 appmHe/dpa.The ion-beam irradiation experiment was carried out at the TIARA facility of JAERI. Specimens were irradiated at 633 K by 10.5 MeV Fe ions with/without 1.05 MeV He ions. Micro-indentation tests were performed at loads to penetrate about 0.40 mm in the irradiated specimens using an UMIS-2000. The results are summarized as follows:1) As a result of the single irradiated F82H, the micro-hardness tended to increase about 30 dpa. 2) The extra radiation hardening was obviously caused by co-implanted helium atoms more than 1000 appm in F82H irradiated at 633 K. 3) In the dual-beam (100 appmHe/dpa) irradiated microstructure, nano-voids and fine defects were observed. It is suggested that the formation of nano-voids causes the extra radiation hardening by helium co-implantation.
Tanigawa, Hiroyasu; Jitsukawa, Shiro; Hishinuma, Akimichi; Ando, Masami*; Kato, Yudai*; Koyama, Akira*; Iwai, Takeo*
Journal of Nuclear Materials, 283-287(Part.1), p.470 - 473, 2000/12
Times Cited Count：21 Percentile：77.56(Materials Science, Multidisciplinary)no abstracts in English
